Using wavelet transform to evaluate single-shot phase measuring deflectometry data
Autoren |
Hanning Liang |
|---|---|
Medien | Proc. SPIE 11510, Applications of Digital Image Processing XLIII, 115101S, Aug. 2020. |
Veröffentlichungsjahr | 2020 |
Veröffentlichungsart | Konferenzbeitrag (peer reviewed) |
DOI | |
Zitierung | Liang, Hanning; Faber, Christian (2020): Using wavelet transform to evaluate single-shot phase measuring deflectometry data. Proc. SPIE 11510, Applications of Digital Image Processing XLIII, 115101S, Aug. 2020. . DOI: 10.1117/12.2567301 |
Peer Reviewed | Ja |